ZEISS introduces the confocal laser scanning microscope ZEISS LSM 800 for materials applications and analysis in research and industry.
ZEISS LSM 800 enables precise, three-dimensional imaging of microstructures and surfaces. The combination of confocal fluorescence and other contrasting techniques in one instrument enables high-precision examination of nanomaterials, metals, polymers, and semiconductors with maximum information content. The system offers precise capture of 3D topography and the investigation of nanometer-scaled structures without causing surface damage.
You can find further information here:
http://www.zeiss.com/pr?id=ZEISS-LSM-800-for-materials
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