Prior Scientific's Queensgate and NPL revealed their latest breakthrough at Euspen's Special Interest Conference: Precision Motion Systems and Control in November.
The development is a novel control system for a two-axis flexure stage with a 100 µm x 100 µm scanning range that enables high-speed atomic force microscopy (HS-AFM) over large areas. The result is an HS-AFM system capable of imaging large areas with molecular-level resolution.
Download the poster presented by the team.
This development was enabled following the fourth project that Queensgate and NPL have collaborated on as part of the Innovate UK's Analysis for Innovation (A4I) program. The aim is to qualify the implementation of arbitrary 2D scan paths using either contoured or position-velocity-time (PVT) motion trajectories.
Previous collaborations have already pushed the boundaries of what is possible in the field of nanopositioning such as improved velocity control and multi-axis correction - all of which produce tangible benefits for users or developers of nanopositioning systems.
“Our collaboration with Queensgate has yielded reciprocal benefits over a wide range of joint R&D projects for the past decade or so.”
Andrew Yacoot Principal Research Scientist National Physical Laboratory
Previous projects between Queensgate and NPL:
Closed-loop velocity control for fast imaging techniques
Velocity control capitalizes on the ability to operate the stage at higher speeds than previously possible. This enables HS-AFM use with larger, heavier samples than previously. This was an NPL Measurement for Recovery project.
Spatial positioning correction for multi-axis nanopositioning stages
Queensgate has developed high-performance open frame multi-axis flexure stages capable of operation in closed-loop over extended ranges (400 μm-800 μm) in X, Y and Z axes.
Developing a mathematical model for multi-axis control
NPL worked with Queensgate's engineers to develop an algorithm to enhance the precision of its nanopositioning stages.
Interested in discovering more about our nanopositioning solutions for increasing scanning ranges for high-speed atomic force microscopy? Contact us to discuss your application.
